Srivatsan Seshadri
Inventor
Stats
- 5 US patents issued
- 18 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 5 US Patents Issued
- 18 US Applications Filed
- 212 Total Citation Count
- Apr 28, 2023 Most Recent Filing
- Jan 10, 2002 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| SIGRAY, INC. | 2
| 2017
|
| Osmic, Inc. | 1
| 2002
|
| XRADIA, INC. | 1
| 2005
|
| CARL ZEISS X-RAY MICROSCOPY, INC. | 1
2 6 1 | 2006
2007 2013 2016 |
Inventor Addresses
| Address | Duration |
|---|---|
| Martinez, CA, US | Sep 14, 17 - Jul 16, 19 |
| Pleasanton, CA, US | Sep 13, 18 - Nov 02, 23 |
| Pleasnton, CA, US | Sep 17, 19 - Sep 17, 19 |
| Pleasonton, CA, US | Nov 23, 17 - Nov 23, 17 |
| San Ramon, CA, US | Mar 13, 14 - Jul 02, 19 |
| Troy, MI, US | Jul 10, 03 - Jul 10, 03 |
| Walnut Creek, CA | May 17, 07 - Oct 28, 08 |
| Walnut Creek, CA, US | Apr 05, 11 - Apr 05, 11 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| A61B: | DIAGNOSIS; SURGERY; IDENTIFICATION | 4 |
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 15 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2023/0349,842 | 2023 | X-RAY SEQUENTIAL ARRAY WAVELENGTH DISPERSIVE SPECTROMETER | 1 |
| 11428651 | 2022 | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements | 0 |
| 2022/0082,516 | 2022 | SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL ANALYZER AND A PLURALITY OF DETECTOR ELEMENTS | 0 |
| 11215572 | 2022 | System and method for x-ray absorption spectroscopy using a crystal analyzer and a plurality of detector elements | 7 |
| 2021/0356,412 | 2021 | SYSTEM AND METHOD FOR X-RAY ABSORPTION SPECTROSCOPY USING A CRYSTAL ANALYZER AND A PLURALITY OF DETECTOR ELEMENTS | 5 |
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