Ronald J Schutz

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
AT&T Bell Laboratories
2
2
1
1
1989
1990
1991
1993
INFINEON TECHNOLOGIES AG
1
1
1
2000
2005
2006
BELL TELEPHONE LABORATORIES, INCORPORATED
1
2
1
1984
1989
1991
INTERNATIONAL BUSINESS MACHINES CORPORATION
1
2
1
1
1998
1999
2000
2005
QIMONDA AG
2
1999
AGERE SYSTEMS GUARDIAN CORP.
1
1991
AGERE SYSTEMS INC.
1
1
1988
1991
AMERICAN TELEPHONE AND TELEGRAPH COMPANY
1
1
2
2
2
1984
1988
1989
1990
1991
INFINEON TECHNOLOGIES NORTH AMERICA CORP.
1
1998
AT&T Labs, Inc.
1
1988
SAMSUNG ELECTRONICS CO., LTD.
1
1998
TOSHIBA MEMORY CORPORATION
1
1999

Inventor Addresses

AddressDuration
14 Upper Warren Way, Warren, NJ 07060Sep 22, 92 - Sep 22, 92
Austin, TXNov 24, 92 - Nov 24, 92
Dresden, DEJan 05, 06 - Sep 27, 07
Millbrook, NYMar 14, 00 - Jul 16, 02
Warren, NJJul 14, 87 - Sep 07, 93

Technology Profile

Technology Matters
B44C: PRODUCING DECORATIVE EFFECTS 2
C03C: CHEMICAL COMPOSITION OF GLASSES, GLAZES, OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS 4
H01L: SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 16

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2007/0221,6132007Structure for stopping mechanical cracks in a substrate wafer, use of the structure and a method for producing the structure11
2006/0001,1622006Nitride and polysilicon interface with titanium layer7
64202672002Method for forming an integrated barrier/plug for a stacked capacitor3
63588502002Slurry-less chemical-mechanical polishing of oxide materials3
63035062001Compositions for and method of reducing/eliminating scratches and defects in silicon dioxide during CMP process7

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.