Ralph Schlief
Inventor
Stats
- 3 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 3 US Applications Filed
- 420 Total Citation Count
- Jun 27, 2014 Most Recent Filing
- Oct 9, 2002 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| ASML NETHERLANDS B.V. | 2
2 | 2002
2007 |
| GLOBALFOUNDRIES INC. | 2
| 2014
|
Inventor Addresses
| Address | Duration |
|---|---|
| Albany, NY, US | Dec 31, 15 - Jul 19, 16 |
| Mountain View, CA | Feb 13, 07 - May 24, 07 |
| Mountain View, CA, US | May 01, 03 - Oct 26, 10 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
| G03C: | PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES | 1 |
| G03F: | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 9397012 | 2016 | Test pattern for feature cross-sectioning | 0 |
| 2015/0380,320 | 2015 | TEST PATTERN FOR FEATURE CROSS-SECTIONING | 1 |
| 7820341 | 2010 | Method of two dimensional feature model calibration and optimization | 9 |
| 2007/0117,030 | 2007 | Method of two dimensional feature model calibration and optimization | 13 |
| 7175940 | 2007 | Method of two dimensional feature model calibration and optimization | 263 |
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