Michael J Schaffer

Inventor

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Work History

Patent OwnerApplications FiledYear
RAYTHEON COMPANY
1
1988
DIMENSIONAL METROLOGY SYSTEMS
1
1986
INTEL CORPORATION
1
2
1
2
2000
2001
2003
2004
The United States of America as represented by the United States Department of Energy
2
1
1979
1991
THE BOEING COMPANY
2
2015
SIMMONS JUVENILE PRODUCTS COMPANY INC.
16
1981
GENERAL ATOMICS
2
1
1977
1985
Nawsir Inc.
1
1989

Inventor Addresses

AddressDuration
7 Main St., Flanders, NJ 07836Nov 01, 88 - Nov 01, 88
Beaverton, ORNov 16, 04 - Jan 01, 08
Beaverton, OR, USApr 24, 03 - Feb 02, 10
Mendham, NJMay 15, 90 - May 15, 90
New London, WIJun 07, 83 - Sep 18, 84
Olympia, WA, USMay 04, 17 - Sep 20, 22
San Diego, CAAug 12, 80 - Oct 04, 94
Torrance, CAMay 01, 90 - May 01, 90

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 1
D06D: 1
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 4

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
114484972022Systems and methods of determining image scaling0
111704682021Systems and methods of determining image scaling0
2021/0192,6822021Systems and Methods of Determining Image Scaling0
2021/0190,4892021Systems and Methods of Determining Image Scaling0
96962632017Borescope calibrator and user check gauge0

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