Abhijeet SAMUDRA

Inventor

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Inventor Addresses

AddressDuration
Santa Clara, CA, USApr 21, 22 - Nov 12, 24
Sunnyvale, CA, USJan 02, 24 - Jan 02, 24

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3
G06F: ELECTRIC DIGITAL DATA PROCESSING 2

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
121406322024Device under test synchronization with automated test equipment check cycle0
118607512024Deterministic data latency in serializer/deserializer-based design for test systems0
116623832023High-speed functional protocol based test and debug0
2022/0155,3702022DEVICE UNDER TEST SYNCHRONIZATION WITH AUTOMATED TEST EQUIPMENT CHECK CYCLE0
2022/0120,8112022HIGH-SPEED FUNCTIONAL PROTOCOL BASED TEST AND DEBUG0

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