Takashi Saida

Inventor

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Work History

Patent OwnerApplications FiledYear
FUJI PHOTO FILM CO., LTD.
2
1
1981
1982
NIPPON TELEGRAPH AND TELEPHONE CORPORATION
6
6
4
2
2
1
2
2
2
14
2
1
2001
2002
2005
2006
2007
2008
2009
2010
2011
2012
2013
2014
NTT ELECTRONICS CORPORATION
1
2
2
2
2008
2009
2011
2012

Inventor Addresses

AddressDuration
Asaka, JPJun 14, 83 - Nov 22, 83
Atsugi, JPJan 01, 13 - May 12, 20
Atsugi-shi, JPMay 30, 13 - Sep 17, 15
Atsugi-shi, Kanagawa-ken, JPJul 12, 18 - Nov 21, 19
Kanagawa, JPDec 23, 10 - Dec 23, 10
Kanagawa-ken, JPMay 05, 11 - May 05, 11
Mito, JPSep 23, 03 - Dec 26, 06
Mito-shi, JPSep 20, 01 - Nov 14, 02
Musashino, JPOct 01, 24 - Oct 01, 24
Musashino-shi, Tokyo, JPMar 17, 22 - Mar 17, 22
Sagamihara, JPApr 20, 04 - Oct 08, 13
Sagamihara-shi, JPFeb 13, 03 - Dec 06, 12
Saitama, JPJan 22, 85 - Jan 22, 85
Tokyo, JPSep 18, 08 - Mar 26, 19
Yokohama, JPJun 18, 13 - Jun 18, 13

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1
G02B: OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 21

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
121076262024Wavelength monitoring device and controlling method thereof0
2022/0086,5382022Wavelength Monitoring Device and Controlling Method Thereof0
106491472020Optical module0
2019/0353,8442019OPTICAL MODULE4
103177092019Optical modulator2

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