Heimo Saarikko
Inventor
Stats
- 0 US patents issued
- 1 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 1 US Applications Filed
- 10 Total Citation Count
- Dec 9, 2009 Most Recent Filing
- Dec 9, 2009 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| UNIVERSITY OF HELSINKI | 1
| 2009
|
Inventor Addresses
| Address | Duration |
|---|---|
| Helsinki, FI | Oct 27, 11 - Oct 27, 11 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2011/0261,347 | 2011 | Method for interferometric detection of surfaces | 7 |
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