Dmitry Yurjevich SOKOLOV
Inventor
Stats
- 0 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 3 US Applications Filed
- 1 Total Citation Count
- May 18, 2017 Most Recent Filing
- May 18, 2017 Earliest Filing
Work History
No Work History Available.Inventor Addresses
| Address | Duration |
|---|---|
| Moscow, RU | Jul 18, 19 - Feb 01, 22 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01Q: | SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 11237186 | 2022 | Wide-field scanning probe microscope combined with an apparatus for modifying an object | 0 |
| 11150266 | 2021 | Scanning probe nanotomograph comprising an optical analysis module | 0 |
| 10690698 | 2020 | Scanning probe microscope combined with a device for acting on a probe and a specimen | 0 |
| 2019/0219,609 | 2019 | SCANNING PROBE MICROSCOPE COMBINED WITH A DEVICE FOR ACTING ON A PROBE AND A SPECIMEN | 1 |
| 2019/0219,610 | 2019 | WIDE-FIELD SCANNING PROBE MICROSCOPE COMBINED WITH AN APPARATUS FOR MODIFYING AN OBJECT | 0 |
We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
>
Upgrade to our Level for up to -1 portfolios!.