Yusuke Seki
Inventor
Stats
- 11 US patents issued
- 34 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 11 US Patents Issued
- 34 US Applications Filed
- 109 Total Citation Count
- Dec 1, 2023 Most Recent Filing
- Nov 12, 2003 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
OKB CO., LTD. | 1
| 2013
|
HITACHI, LTD. | 2
1 2 2 2 2 3 | 2003
2004 2007 2008 2009 2010 2012 |
HITACHI HIGH-TECHNOLOGIES CORPORATION | 2
4 2 | 2005
2006 2007 |
HITACHI INDUSTRY & CONTROL SOLUTIONS, LTD. | 2
| 2009
|
HITACHI INFORMATION & CONTROL SOLUTIONS, LTD. | 2
| 2010
|
NIPPON LIGHT METAL COMPANY, LTD. | 1
2 1 | 2013
2014 2015 |
Hitachi Information & Contorl Solutions | 1
| 2010
|
Inventor Addresses
Address | Duration |
---|---|
CHIBA-KEN, JP | Jun 20, 24 - Jun 20, 24 |
Fujimino, JP | Nov 16, 21 - Nov 16, 21 |
Fujimino-shi, JP | Oct 03, 19 - Sep 22, 22 |
Hitachi, JP | Dec 24, 09 - Dec 08, 15 |
Musashino, JP | Jun 04, 09 - Feb 12, 13 |
Nagoya-shi, Aichi, JP | Mar 03, 22 - Mar 03, 22 |
Setagaya-ku, Tokyo, JP | Jan 19, 23 - Jan 19, 23 |
Shizuoka, JP | Jun 04, 19 - Feb 15, 22 |
Shizuoka-shi, JP | Jun 18, 15 - Sep 24, 20 |
Tokyo, JP | Jun 03, 04 - Aug 17, 23 |
Technology Profile
Technology | Matters | |
---|---|---|
A61B: | DIAGNOSIS; SURGERY; IDENTIFICATION | 10 |
B24B: | MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING | 1 |
B24C: | ABRASIVE OR RELATED BLASTING WITH PARTICULATE MATERIAL | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2024/0205,149 | 2024 | COMMUNICATION METHOD, COMMUNICATION DEVICE, AND COMMUNICATION SYSTEM | 0 |
2023/0260,739 | 2023 | Charged Particle Beam Device and Scan Waveform Generation Method | 0 |
2023/0237,546 | 2023 | PROGRAM, INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND MODEL GENERATION METHOD | 0 |
2023/0230,244 | 2023 | PROGRAM, MODEL GENERATION METHOD, INFORMATION PROCESSING DEVICE, AND INFORMATION PROCESSING METHOD | 0 |
2023/0197,400 | 2023 | Charged Particle Beam Device and Sample Observation Method | 0 |
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