Yusuke Seki

Inventor

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Work History

Patent OwnerApplications FiledYear
OKB CO., LTD.
1
2013
HITACHI, LTD.
2
1
2
2
2
2
3
2003
2004
2007
2008
2009
2010
2012
HITACHI HIGH-TECHNOLOGIES CORPORATION
2
4
2
2005
2006
2007
HITACHI INDUSTRY & CONTROL SOLUTIONS, LTD.
2
2009
HITACHI INFORMATION & CONTROL SOLUTIONS, LTD.
2
2010
NIPPON LIGHT METAL COMPANY, LTD.
1
2
1
2013
2014
2015
Hitachi Information & Contorl Solutions
1
2010

Inventor Addresses

AddressDuration
CHIBA-KEN, JPJun 20, 24 - Jun 20, 24
Fujimino, JPNov 16, 21 - Nov 16, 21
Fujimino-shi, JPOct 03, 19 - Sep 22, 22
Hitachi, JPDec 24, 09 - Dec 08, 15
Musashino, JPJun 04, 09 - Feb 12, 13
Nagoya-shi, Aichi, JPMar 03, 22 - Mar 03, 22
Setagaya-ku, Tokyo, JPJan 19, 23 - Jan 19, 23
Shizuoka, JPJun 04, 19 - Feb 15, 22
Shizuoka-shi, JPJun 18, 15 - Sep 24, 20
Tokyo, JPJun 03, 04 - Aug 17, 23

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 10
B24B: MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING 1
B24C: ABRASIVE OR RELATED BLASTING WITH PARTICULATE MATERIAL 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0205,1492024COMMUNICATION METHOD, COMMUNICATION DEVICE, AND COMMUNICATION SYSTEM0
2023/0260,7392023Charged Particle Beam Device and Scan Waveform Generation Method0
2023/0237,5462023PROGRAM, INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND MODEL GENERATION METHOD0
2023/0230,2442023PROGRAM, MODEL GENERATION METHOD, INFORMATION PROCESSING DEVICE, AND INFORMATION PROCESSING METHOD0
2023/0197,4002023Charged Particle Beam Device and Sample Observation Method0

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