Bruno W Schueler

Inventor

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Details

Work History

Patent OwnerApplications FiledYear
INTEL CORPORATION
2
2005
HIGH VOLTAGE ENGINEERING CORPORATION
1
1
1989
1996
NOVA MEASURING INSTRUMENTS INC.
1
1
2
2
2
2
2
1
1989
1996
2005
2009
2011
2013
2014
2017

Inventor Addresses

AddressDuration
2208 Glenkirk Dr., San Jose, CA 95124Jun 10, 97 - Jun 10, 97
Redwood City, CAJul 07, 92 - Jul 07, 92
San Jose, CAJul 15, 08 - Jul 15, 08
San Jose, CA, USMar 29, 07 - Jan 02, 25

Technology Profile

Technology Matters
B23P: OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS 1
B23Q: DETAILS, COMPONENTS, OR ACCESSORIES FOR MACHINE TOOLS, e.g. ARRANGEMENTS FOR COPYING OR CONTROLLING 1
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0006,4512025PATTERNED X-RAY EMITTING TARGET0
121658632024Systems and approaches for semiconductor metrology and surface analysis using secondary ion mass spectrometry0
2024/0345,0062024SYSTEM AND METHOD FOR MEASURING A SAMPLE BY X-RAY REFLECTANCE SCATTEROMETRY0
119962592024Patterned x-ray emitting target0
2024/0087,8692024SYSTEMS AND APPROACHES FOR SEMICONDUCTOR METROLOGY AND SURFACE ANALYSIS USING SECONDARY ION MASS SPECTROMETRY0

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