Phil Rutschman

Inventor

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Work History

Patent OwnerApplications FiledYear
TOKITAE LLC
2
2015

Inventor Addresses

AddressDuration
Seattle, WA, USAug 25, 16 - Apr 18, 17

Technology Profile

Technology Matters
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
96253852017Photothermal spectroscopy systems for offset synchronous testing of flow assays and methods of using same0
2016/0245,7482016PHOTOTHERMAL SPECTROSCOPY SYSTEMS FOR OFFSET SYNCHRONOUS TESTING OF FLOW ASSAYS AND METHODS OF USING SAME2

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