Anthonius Ruiter
Inventor
Stats
- 1 US patents issued
- 7 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 1 US Patents Issued
- 7 US Applications Filed
- 12 Total Citation Count
- Feb 2, 2024 Most Recent Filing
- Mar 21, 2011 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
BRUCKER NANO, INC. | 1
| 2011
|
BRUKER NANO, INC. | 2
| 2011
|
Inventor Addresses
Address | Duration |
---|---|
Goleta, CA, US | Sep 29, 11 - Mar 04, 25 |
Technology Profile
Technology | Matters | |
---|---|---|
B82Y: | SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES | 5 |
G01Q: | SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] | 7 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
12241911 | 2025 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | 0 |
2024/0175,895 | 2024 | Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA) | 0 |
11940461 | 2024 | Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA) | 1 |
2023/0243,867 | 2023 | Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) | 0 |
2022/0252,638 | 2022 | Nanoscale Dynamic Mechanical Analysis via Atomic Force Microscopy (AFM-nDMA) | 0 |
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