Pablo Rovira
Inventor
Stats
- 0 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 4 US Applications Filed
- 19 Total Citation Count
- May 12, 2020 Most Recent Filing
- Oct 13, 2015 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| KLA-TENCOR CORPORATION | 1
| 2015
|
Inventor Addresses
| Address | Duration |
|---|---|
| Milpitas, CA, US | Jun 11, 20 - Jan 24, 23 |
| Santa Clara, CA, US | Apr 21, 16 - Mar 08, 22 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 2 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 4 |
| G01Q: | SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 11562289 | 2023 | Loosely-coupled inspection and metrology system for high-volume production process monitoring | 0 |
| 11268901 | 2022 | Variable aperture mask | 0 |
| 2020/0271,569 | 2020 | Variable Aperture Mask | 0 |
| 2020/0184,372 | 2020 | Loosely-Coupled Inspection and Metrology System for High-Volume Production Process Monitoring | 1 |
| 10663392 | 2020 | Variable aperture mask | 0 |
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