J Kirkwood H Rough

Inventor

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Work History

Patent OwnerApplications FiledYear
Zeeger; Jim
1
1975
Zegeer; Jim
1
1976
AENEAS VENTURE CORPORATION
1
1985
Microwave Technology, Inc.
1
1995
FMC CORPORATION
1
1989
KLEINER, PERKINS, CAUFIELD & BYERS III
1
1985
Security Pacific Capital Corporation
1
1985
PLASMA SCIENCE, INC., 272 HARBOR BOULEVARD, BELMONT, CA 94002, A CA CORP.
1
1987
Linear Integrated Systems, Inc.
1
1998
Rodenstock Instruments Corporation
1
1980
NOVELLUS SYSTEMS, INC.
1
1
1
1994
1995
1997
FOOG, INC., A CORP. OF CA
1
1982
KLA-TENCOR CORPORATION
1
2
2
2007
2009
2011
KLA Instruments Corporation
1
1995
KLA-TENCOR TECHNOLOGIES CORPORATION
1
2007

Inventor Addresses

AddressDuration
264 S. 14th St., San Jose, CA 95112Dec 12, 89 - Jul 15, 97
264 South 14th St., San Jose, CA 95112Sep 01, 87 - Sep 01, 87
Palo Alto, CAFeb 05, 80 - Feb 05, 80
San Jose, CAMay 11, 82 - May 01, 01
San Jose, CA, USJan 19, 10 - Apr 23, 13
Toledo, OHJan 27, 81 - Jan 27, 81

Technology Profile

Technology Matters
B44C: PRODUCING DECORATIVE EFFECTS 1
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
84271852013Inline inspection of photovoltaics for electrical defects0
2011/0133,7502011INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS2
79069722011Inline inspection of photovoltaics for electrical defects1
2010/0079,1472010INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS1
76493652010Inline inspection of photovoltaics for electrical defects2

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