J Kirkwood H Rough
Inventor
Stats
- 16 US patents issued
- 16 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 16 US Patents Issued
- 16 US Applications Filed
- 822 Total Citation Count
- Feb 10, 2011 Most Recent Filing
- May 2, 1975 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
Zeeger; Jim | 1
| 1975
|
Zegeer; Jim | 1
| 1976
|
AENEAS VENTURE CORPORATION | 1
| 1985
|
Microwave Technology, Inc. | 1
| 1995
|
FMC CORPORATION | 1
| 1989
|
KLEINER, PERKINS, CAUFIELD & BYERS III | 1
| 1985
|
Security Pacific Capital Corporation | 1
| 1985
|
PLASMA SCIENCE, INC., 272 HARBOR BOULEVARD, BELMONT, CA 94002, A CA CORP. | 1
| 1987
|
Linear Integrated Systems, Inc. | 1
| 1998
|
Rodenstock Instruments Corporation | 1
| 1980
|
NOVELLUS SYSTEMS, INC. | 1
1 1 | 1994
1995 1997 |
FOOG, INC., A CORP. OF CA | 1
| 1982
|
KLA-TENCOR CORPORATION | 1
2 2 | 2007
2009 2011 |
KLA Instruments Corporation | 1
| 1995
|
KLA-TENCOR TECHNOLOGIES CORPORATION | 1
| 2007
|
Inventor Addresses
Address | Duration |
---|---|
264 S. 14th St., San Jose, CA 95112 | Dec 12, 89 - Jul 15, 97 |
264 South 14th St., San Jose, CA 95112 | Sep 01, 87 - Sep 01, 87 |
Palo Alto, CA | Feb 05, 80 - Feb 05, 80 |
San Jose, CA | May 11, 82 - May 01, 01 |
San Jose, CA, US | Jan 19, 10 - Apr 23, 13 |
Toledo, OH | Jan 27, 81 - Jan 27, 81 |
Technology Profile
Technology | Matters | |
---|---|---|
B44C: | PRODUCING DECORATIVE EFFECTS | 1 |
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 3 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
8427185 | 2013 | Inline inspection of photovoltaics for electrical defects | 0 |
2011/0133,750 | 2011 | INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS | 2 |
7906972 | 2011 | Inline inspection of photovoltaics for electrical defects | 1 |
2010/0079,147 | 2010 | INLINE INSPECTION OF PHOTOVOLTAICS FOR ELECTRICAL DEFECTS | 1 |
7649365 | 2010 | Inline inspection of photovoltaics for electrical defects | 2 |
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