John G Rohrbaugh
Inventor
Stats
- 23 US patents issued
- 27 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 23 US Patents Issued
- 27 US Applications Filed
- 537 Total Citation Count
- Apr 6, 2004 Most Recent Filing
- Apr 6, 1992 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
AGILENT TECHNOLOGIES, INC. | 1
1 | 2000
2003 |
CALLAHAN CELLULAR L.L.C. | 2
2 | 2002
2004 |
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD. | 3
2 1 1 2 2 8 3 1 | 1992
1995 1997 1998 2000 2001 2002 2003 2004 |
III HOLDINGS 1, LLC | 1
2 5 | 2000
2002 2003 |
AVAGO TECHNOLOGIES GENERAL IP PTE. LTD. | 4
3 3 | 2002
2003 2004 |
Inventor Addresses
Address | Duration |
---|---|
Fort Collins, CO | Jan 10, 95 - May 09, 06 |
Fort Collins, CO, US | Sep 26, 02 - Apr 07, 09 |
Ft Collins, CO | May 28, 02 - Nov 21, 06 |
Ft Collins, CO, US | Mar 04, 04 - Aug 05, 04 |
Ft. Collins, CO | May 18, 99 - Sep 23, 04 |
Ft.Collins, CO | May 22, 01 - May 22, 01 |
Technology Profile
Technology | Matters | |
---|---|---|
G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 17 |
G04F: | TIME-INTERVAL MEASURING | 1 |
G06F: | ELECTRIC DIGITAL DATA PROCESSING | 15 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
7516379 | 2009 | Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC) | 15 |
7139955 | 2006 | Hierarchically-controlled automatic test pattern generation | 19 |
7043674 | 2006 | Systems and methods for facilitating testing of pads of integrated circuits | 17 |
6986085 | 2006 | Systems and methods for facilitating testing of pad drivers of integrated circuits | 7 |
2005/0229,056 | 2005 | Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC) | 12 |
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