John G Rohrbaugh

Inventor

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Work History

Patent OwnerApplications FiledYear
AGILENT TECHNOLOGIES, INC.
1
1
2000
2003
CALLAHAN CELLULAR L.L.C.
2
2
2002
2004
AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
3
2
1
1
2
2
8
3
1
1992
1995
1997
1998
2000
2001
2002
2003
2004
III HOLDINGS 1, LLC
1
2
5
2000
2002
2003
AVAGO TECHNOLOGIES GENERAL IP PTE. LTD.
4
3
3
2002
2003
2004

Inventor Addresses

AddressDuration
Fort Collins, COJan 10, 95 - May 09, 06
Fort Collins, CO, USSep 26, 02 - Apr 07, 09
Ft Collins, COMay 28, 02 - Nov 21, 06
Ft Collins, CO, USMar 04, 04 - Aug 05, 04
Ft. Collins, COMay 18, 99 - Sep 23, 04
Ft.Collins, COMay 22, 01 - May 22, 01

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 17
G04F: TIME-INTERVAL MEASURING 1
G06F: ELECTRIC DIGITAL DATA PROCESSING 15

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
75163792009Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC)15
71399552006Hierarchically-controlled automatic test pattern generation19
70436742006Systems and methods for facilitating testing of pads of integrated circuits17
69860852006Systems and methods for facilitating testing of pad drivers of integrated circuits7
2005/0229,0562005Circuit and method for comparing circuit performance between functional and AC scan testing in an integrated circuit (IC)12

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