Peter L Reutiman

Inventor

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Work History

Patent OwnerApplications FiledYear
Metrologic Instruments, Inc.
2
1
1
2011
2014
2016
HONEYWELL INTERNATIONAL INC.
6
2
1
2006
2008
2010

Inventor Addresses

AddressDuration
Crystal, MNJul 19, 07 - Jul 26, 07
Crystal, MN, USDec 10, 09 - Jun 14, 16
Morristown, NJ, USJul 05, 12 - Mar 07, 17

Technology Profile

Technology Matters
B01L: CHEMICAL OR PHYSICAL LABORATORY APPARATUS FOR GENERAL USE 1
G01M: TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 4

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
95891662017Laser scanning system employing an optics module capable of forming a laser beam having an extended depth of focus (DOF) over the laser scanning field0
2016/0283,7622016LASER SCANNING SYSTEM EMPLOYING AN OPTICS MODULE CAPABLE OF FORMING A LASER BEAM HAVING AN EXTENDED DEPTH OF FOCUS (DOF) OVER THE LASER SCANNING FIELD0
93677192016Laser scanning system employing an optics module capable of forming a laser beam having an extended depth of focus (DOF) over the laser scanning field1
2015/0048,1682015LASER SCANNING SYSTEM EMPLOYING AN OPTICS MODULE CAPABLE OF FORMING A LASER BEAM HAVING AN EXTENDED DEPTH OF FOCUS (DOF) OVER THE LASER SCANNING FIELD384
88448232014Laser scanning system employing an optics module capable of forming a laser beam having an extended depth of focus (DOF) over the laser scanning field495

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