Maxime Jean Rattier

Inventor

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Work History

Patent OwnerApplications FiledYear
LUSTERA, INC.
1
2005
Luxtera, Inc.
6
22
1
2
2003
2005
2006
2007
Luxtern, Inc.
1
2005
SILICON VALLEY BANK
1
2006

Inventor Addresses

AddressDuration
Paris, FRJan 31, 06 - Nov 10, 09
Pasadena, CAMay 03, 05 - Nov 18, 08
Pasadena, CA, USMay 13, 04 - Jan 11, 07

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 2
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
76169042009Waveguide photodetector with integrated electronics53
75866082009Wafer-level testing of optical and optoelectronic chips17
74531322008Waveguide photodetector with integrated electronics48
72628522007Wafer-level testing of optical and optoelectronic chips15
72602932007Optical waveguide grating coupler with varying scatter cross sections34

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