Sungyoon Ryu
Inventor
Stats
- 1 US patents issued
- 14 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 1 US Patents Issued
- 14 US Applications Filed
- 4 Total Citation Count
- Jul 25, 2024 Most Recent Filing
- Oct 14, 2009 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| KOREA ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY | 2
| 2009
|
Inventor Addresses
| Address | Duration |
|---|---|
| Busan, KR | Sep 09, 10 - Aug 07, 12 |
| Seoul, KR | Aug 12, 21 - Nov 21, 24 |
| Suwon-si, KR | May 13, 21 - Jan 02, 25 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 2 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 9 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2025/0003,734 | 2025 | MATERIAL MEASUREMENT SYSTEM AND METHOD | 0 |
| 2024/0385,220 | 2024 | TEST APPARATUS AND TEST METHOD THEREOF | 0 |
| 12092656 | 2024 | Test apparatus and test method thereof | 0 |
| 2024/0255,439 | 2024 | DEFECT DETECTION DEVICE AND DEFECT DETECTION METHOD | 0 |
| 2024/0230,528 | 2024 | TERAHERTZ SIGNAL MEASURING APPARATUS AND MEASURING METHOD | 0 |
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