Pengpeng REN
Inventor
Stats
- 0 US patents issued
- 2 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 2 US Applications Filed
- 0 Total Citation Count
- Mar 26, 2024 Most Recent Filing
- Jan 8, 2014 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| PEKING UNIVERSITY | 1
| 2014
|
Inventor Addresses
| Address | Duration |
|---|---|
| Beijing, CN | Jun 02, 16 - Jun 02, 16 |
| Shanghai, CN | Aug 13, 24 - Aug 13, 24 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 1 |
| G06F: | ELECTRIC DIGITAL DATA PROCESSING | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 12061849 | 2024 | Modeling method of flicker noise of small-sized semiconductor device | 0 |
| 2016/0153,923 | 2016 | METHOD FOR EXTRACTING TRAP TIME CONSTANT OF GATE DIELECTRIC LAYER IN SEMICONDUCTOR DEVICE | 0 |
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