Dirk Preikszas

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
CARL ZEISS MICROSCOPY GMBH
2
2
3
6
3
1
1
6
2008
2009
2010
2011
2012
2014
2015
2016
Carl-Zeiss-Stiftung
1
1992
LEO ELECTRONEMIKROSKOPIE GMBH
1
2003
Carl Zeiss NTS Limited
2
2011
CARL ZEISS NTS GMBH
5
2
1
2
2
4
2
2003
2004
2006
2007
2008
2009
2011
LEO ELEKTRONENMIKROSKOPIE GMBH
2
2003

Inventor Addresses

AddressDuration
Aschaffenburg, DEJun 07, 94 - Feb 15, 05
Oberkochen, DEApr 22, 04 - Nov 07, 24
Okerkochen, DEApr 21, 09 - Apr 21, 09

Technology Profile

Technology Matters
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1
G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 9

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0371,5972024MULTIPOLE ELEMENT, IMAGE ERROR CORRECTOR AND PARTICLE BEAM SYSTEM0
2024/0302,5422024PARTICLE BEAM MICROSCOPE0
2024/0258,0652024METHOD OF OPERATING A PARTICLE BEAM SYSTEM AND COMPUTER PROGRAM PRODUCT0
119159072024Method for operating a particle beam microscope0
2022/0415,6042022PARTICLE BEAM SYSTEM HAVING A MULTI-POLE LENS SEQUENCE FOR INDEPENDENTLY FOCUSSING A MULTIPLICITY OF INDIVIDUAL PARTICLE BEAMS, AND ITS USE AND ASSOCIATED METHOD0

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.