Steffen Porthun
Inventor
Stats
- 2 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 2 US Patents Issued
- 3 US Applications Filed
- 10 Total Citation Count
- Nov 21, 2014 Most Recent Filing
- Mar 16, 2010 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| RHK TECHNOLOGY, INC. | 1
2 1 | 2010
2011 2014 |
Inventor Addresses
| Address | Duration |
|---|---|
| Teltow, DE | Jan 03, 13 - Apr 09, 15 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B82Y: | SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES | 1 |
| G01Q: | SCANNING-PROBE TECHNIQUES OR APPARATUS; APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING-PROBE MICROSCOPY [SPM] | 2 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2015/0101,086 | 2015 | FREQUENCY MEASURING AND CONTROL APPARATUS WITH INTEGRATED PARALLEL SYNCHRONIZED OSCILLATORS | 0 |
| 8914909 | 2014 | Frequency measuring and control apparatus with integrated parallel synchronized oscillators | 0 |
| 8812976 | 2014 | Programmable equipment configuration method and apparatus | 3 |
| 2013/0007,929 | 2013 | Frequency Measuring and Control Apparatus with Integrated Parallel Synchronized Oscillators | 4 |
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