Philippe Planelle
Inventor
Stats
- 4 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 4 US Patents Issued
- 4 US Applications Filed
- 139 Total Citation Count
- Jan 28, 2009 Most Recent Filing
- Oct 18, 1999 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
STMicroelectronics S.A. | 1
1 2 | 1999
2000 2007 |
STMICROELECTRONICS (GRENOBLE 2) SAS | 2
| 2009
|
Inventor Addresses
Address | Duration |
---|---|
La Tronche, FR | Nov 14, 00 - May 28, 13 |
Technology Profile
Technology | Matters | |
---|---|---|
G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
H01L: | SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR | 1 |
H01R: | ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
8448332 | 2013 | Method and device for transporting electronic modules | 1 |
2010/0325,870 | 2010 | METHOD AND DEVICE FOR TRANSPORTING ELECTRONIC MODULES | 2 |
7422441 | 2008 | Semiconductor component and device and method for connecting such a component, particularly for test purposes | 1 |
2007/0298,651 | 2007 | SEMICONDUCTOR COMPONENT AND DEVICE AND METHOD FOR CONNECTING SUCH A COMPONENT, PARTICULARLY FOR TEST PURPOSES | 0 |
6480013 | 2002 | Method for the calibration of an RF integrated circuit probe | 103 |
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