Vjacheslav Avtonomovich Pivtorak
Inventor
Stats
- 5 US patents issued
- 5 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 5 US Patents Issued
- 5 US Applications Filed
- 18 Total Citation Count
- Jun 18, 2002 Most Recent Filing
- Jun 1, 2000 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| AGELLIS GROUP AB | 4
2 | 2000
2002 |
Inventor Addresses
| Address | Duration |
|---|---|
| Kiev, UA | Oct 24, 02 - Feb 14, 06 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
| G01L: | MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE | 1 |
| G03H: | HOLOGRAPHIC PROCESSES OR APPARATUS | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 6998195 | 2006 | Device for registration of optical holograms on the amorphous molecular semiconductor films | 1 |
| 6998197 | 2006 | Device for registration of optical holograms on the amorphous molecular semiconductor films | 1 |
| 6628399 | 2003 | Method and device real time non-destructive determination of residual stresses in objects by the optical holographic interferometry technique | 2 |
| 6558851 | 2003 | Optical medium for registration of holographic interferograms | 11 |
| 6522409 | 2003 | Method and device for non-destructive inspection of objects by means of optical holographic interferometry | 3 |
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