da Silva, Edevaldo Pereira Jr

Inventor

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Work History

Patent OwnerApplications FiledYear
NXP USA, INC.
2
4
2
1
2010
2012
2015
2016

Inventor Addresses

AddressDuration
AUSTIN, TX, USNov 09, 17 - Jun 08, 23
Austin, TX, USApr 24, 18 - Nov 23, 23
CAMPINAS, BRJun 25, 15 - Jun 25, 15
Campinas, BRMay 31, 12 - Apr 12, 16

Technology Profile

Technology Matters
G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 2
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 3
G06F: ELECTRIC DIGITAL DATA PROCESSING 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2023/0378,8042023Robust Fail-Safe System for Prolonging the Backup Battery Life in Real-Time Low Power MCU Systems0
117332772023Circuits and methods for voltage measurement0
2023/0176,0972023CIRCUITS AND METHODS FOR VOLTAGE MEASUREMENT0
110384272021Charge-cycle control for burst-mode DC-DC converters3
99544852018Amplitude detection with compensation0

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