Jack Pattee

Inventor

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Work History

Patent OwnerApplications FiledYear
AMETEK, INC.
2
2
2
2002
2005
2013

Inventor Addresses

AddressDuration
Davisberg, MIFeb 12, 08 - Feb 12, 08
Davisberg, MI, USJan 04, 07 - Jan 04, 07
Davisburg, MIJun 28, 05 - Aug 22, 06
Davisburg, MI, USSep 18, 14 - Jul 07, 15

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01F: MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
90748602015Systems and methods for magnetostrictive sensing1
2014/0266,1612014SYSTEMS AND METHODS FOR MAGNETOSTRICTIVE SENSING0
73308032008High resolution time interval measurement apparatus and method0
2007/0005,2882007High resolution time interval measurement apparatus and method1
70962872006Automatic address selection method8

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