Jack Pattee
Inventor
Stats
- 4 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 4 US Patents Issued
- 4 US Applications Filed
- 28 Total Citation Count
- Mar 13, 2013 Most Recent Filing
- Mar 22, 2002 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
AMETEK, INC. | 2
2 2 | 2002
2005 2013 |
Inventor Addresses
Address | Duration |
---|---|
Davisberg, MI | Feb 12, 08 - Feb 12, 08 |
Davisberg, MI, US | Jan 04, 07 - Jan 04, 07 |
Davisburg, MI | Jun 28, 05 - Aug 22, 06 |
Davisburg, MI, US | Sep 18, 14 - Jul 07, 15 |
Technology Profile
Technology | Matters | |
---|---|---|
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
G01D: | MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR | 1 |
G01F: | MEASURING VOLUME, VOLUME FLOW, MASS FLOW, OR LIQUID LEVEL; METERING BY VOLUME | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
9074860 | 2015 | Systems and methods for magnetostrictive sensing | 1 |
2014/0266,161 | 2014 | SYSTEMS AND METHODS FOR MAGNETOSTRICTIVE SENSING | 0 |
7330803 | 2008 | High resolution time interval measurement apparatus and method | 0 |
2007/0005,288 | 2007 | High resolution time interval measurement apparatus and method | 1 |
7096287 | 2006 | Automatic address selection method | 8 |
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