NITESH PANDEY
Inventor
Stats
- 3 US patents issued
- 63 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 63 US Applications Filed
- 167 Total Citation Count
- Aug 13, 2024 Most Recent Filing
- Aug 27, 2015 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
ASML NETHERLANDS B.V. | 3
3 4 | 2015
2016 2017 |
VRIJE UNIVERSITEIT AMSTERDAM | 1
| 2015
|
Inventor Addresses
Address | Duration |
---|---|
Eindhoven, NL | Mar 03, 16 - Mar 25, 25 |
San Jose, CA, US | Sep 01, 22 - Dec 03, 24 |
Silicon Valley, CA | Sep 22, 22 - Oct 15, 24 |
Silicon Valley, CA, US | Feb 09, 23 - Feb 27, 25 |
Sillcon Valley, CA, US | Jan 04, 24 - Jan 04, 24 |
Technology Profile
Technology | Matters | |
---|---|---|
B81B: | MICRO-STRUCTURAL DEVICES OR SYSTEMS, e.g. MICRO-MECHANICAL DEVICES | 2 |
F21V: | FUNCTIONAL FEATURES OR DETAILS OF LIGHTING DEVICES OR SYSTEMS THEREOF; STRUCTURAL COMBINATIONS OF LIGHTING DEVICES WITH OTHER ARTICLES, NOT OTHERWISE PROVIDED FOR | 2 |
F21Y: | INDEXING SCHEME ASSOCIATED WITH SUBCLASSES F21L, F21S and F21V, RELATING TO THE FORM OF THE LIGHT SOURCES | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
12259546 | 2025 | Micromirror arrays | 0 |
2025/0067,768 | 2025 | ELEMENT OF AN AFM TOOL | 0 |
12164233 | 2024 | Metrology method and apparatus for of determining a complex-valued field | 0 |
2024/0404,036 | 2024 | DETECTION APPARATUS FOR SIMULTANEOUS ACQUISITION OF MULTIPLE DIVERSE IMAGES OF AN OBJECT | 0 |
12158435 | 2024 | Illumination and detection apparatus for a metrology apparatus | 0 |
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