Thomas Adriaan Ooms
Inventor
Stats
- 3 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 4 US Applications Filed
- 18 Total Citation Count
- Jun 12, 2017 Most Recent Filing
- Mar 30, 2012 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
MAPPER LITHOGRAPHY IP B.V. | 4
2 1 | 2012
2013 2017 |
Inventor Addresses
Address | Duration |
---|---|
Delfgauw, NL | Oct 04, 12 - Sep 28, 17 |
Technology Profile
Technology | Matters | |
---|---|---|
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 4 |
G03B: | APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR | 1 |
G03F: | PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR | 4 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2017/0277,043 | 2017 | LITHOGRAPHY SYSTEM WITH DIFFERENTIAL INTERFEROMETER MODULE | 1 |
9678443 | 2017 | Lithography system with differential interferometer module | 0 |
9551563 | 2017 | Multi-axis differential interferometer | 1 |
9261800 | 2016 | Alignment of an interferometer module for use in an exposure tool | 2 |
2015/0241,200 | 2015 | MULTI-AXIS DIFFERENTIAL INTERFEROMETER | 2 |
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