Thomas Adriaan Ooms

Inventor

Add to Portfolio

Stats

Details

Work History

Patent OwnerApplications FiledYear
MAPPER LITHOGRAPHY IP B.V.
4
2
1
2012
2013
2017

Inventor Addresses

AddressDuration
Delfgauw, NLOct 04, 12 - Sep 28, 17

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 4
G03B: APPARATUS OR ARRANGEMENTS FOR TAKING PHOTOGRAPHS OR FOR PROJECTING OR VIEWING THEM; APPARATUS OR ARRANGEMENTS EMPLOYING ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ACCESSORIES THEREFOR 1
G03F: PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR 4

See more…

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2017/0277,0432017LITHOGRAPHY SYSTEM WITH DIFFERENTIAL INTERFEROMETER MODULE1
96784432017Lithography system with differential interferometer module0
95515632017Multi-axis differential interferometer1
92618002016Alignment of an interferometer module for use in an exposure tool2
2015/0241,2002015MULTI-AXIS DIFFERENTIAL INTERFEROMETER2

See more…


We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
> Upgrade to our Level for up to -1 portfolios!.