'T ROOT Wilhelmus Patrick Elisabeth Maria OP

Inventor

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Work History

Patent OwnerApplications FiledYear
ASML NETHERLANDS B.V.
3
2
1
2014
2015
2017

Inventor Addresses

AddressDuration
Nederweert, NLMar 10, 16 - Feb 20, 25
Veldhoven, NLOct 13, 16 - Oct 16, 18

Technology Profile

Technology Matters
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 4
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G02B: OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 5

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2025/0060,6612025SUBSTRATE COMPRISING A TARGET ARRANGEMENT, ASSOCIATED PATTERNING DEVICE AND METROLOGY METHOD0
2024/0410,8272024METROLOGY APPARATUS AND METROLOGY METHODS BASED ON HIGH HARMONIC GENERATION FROM A DIFFRACTIVE STRUCTURE0
117748672023Radiation measurement system0
116869512023Reducing speckle in an excimer light source0
115696282023Pulse stretcher and method0

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