Hirokazu Nakazawa
Inventor
Stats
- 3 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 4 US Applications Filed
- 177 Total Citation Count
- Aug 9, 2012 Most Recent Filing
- Sep 28, 2006 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| NATIONAL UNIVERSITY CORPORATION TOYOHASHI UNIVERSITY OF TECHNOLOGY | 2
1 2 | 2008
2010 2012 |
| MONUMENT PEAK VENTURES, LLC | 2
| 2006
|
Inventor Addresses
| Address | Duration |
|---|---|
| Aichi, JP | Sep 29, 11 - Jan 05, 12 |
| Nagano, JP | Sep 27, 07 - Sep 15, 09 |
| Toyohashi, JP | Nov 01, 16 - Nov 01, 16 |
| Toyohashi-shi, JP | Jul 17, 14 - Jul 17, 14 |
| Toyoshashi, JP | Mar 05, 13 - Mar 05, 13 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 2 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 9482641 | 2016 | Device and method for detecting chemical and physical phenomena | 0 |
| 2014/0200,842 | 2014 | Device and Method for Detecting Chemical and Physical Phenomena | 4 |
| 8388893 | 2013 | Combined detector | 0 |
| 2012/0002,201 | 2012 | Spectral Device and Method for Controlling Same | 3 |
| 2011/0236,263 | 2011 | Combined Detector | 98 |
We are sorry but your current selection exceeds the maximum number of portfolios (0) for this membership level.
>
Upgrade to our Level for up to -1 portfolios!.