Esteban G Najle

Inventor

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Work History

Patent OwnerApplications FiledYear
Advanced Testing Technologies, Inc.
1
1
1991
1992
HARRIS CORPORATION
1
1992

Inventor Addresses

AddressDuration
Orlando, FLAug 09, 94 - Aug 09, 94
Smithtown, NYJan 12, 93 - Jan 12, 93

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
53370141994Phase noise measurements utilizing a frequency down conversion/multiplier, direct spectrum measurement technique168
51793441993Phase noise measurements utilizing a frequency down conversion/multiplier, direct spectrum measurement technique23

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