Florin Munteanu

Inventor

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Work History

Patent OwnerApplications FiledYear
BRUKER NANO, INC.
4
2
1
1
4
1
2
2007
2008
2009
2010
2012
2014
2016

Inventor Addresses

AddressDuration
LIVERMORE, CA, USJan 26, 17 - Jan 26, 17
Livermore, CA, USSep 05, 17 - Sep 05, 17
Tucson, AZ, USJan 01, 09 - Mar 08, 16

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 8
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1
G04F: TIME-INTERVAL MEASURING 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
97528682017Optical measurement of lead angle of groove in manufactured part1
2017/0023,3562017OPTICAL MEASUREMENT OF LEAD ANGLE OF GROOVE IN MANUFACTURED PART0
92823042016Full-color images produced by white-light interferometry2
84827412013Interferometric measurement of non-homogeneous multi-material surfaces0
84164252013Interferometric measurement of non-homogeneous multi-material surfaces0

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