Jong-I Mou
Inventor
Stats
- 50 US patents issued
- 55 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 50 US Patents Issued
- 55 US Applications Filed
- 438 Total Citation Count
- Oct 2, 2015 Most Recent Filing
- Mar 11, 2004 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. | 22
20 12 18 17 4 7 | 2009
2010 2011 2012 2013 2014 2015 |
Inventor Addresses
| Address | Duration |
|---|---|
| HSINCHU CITY, TW | Nov 06, 14 - Nov 06, 14 |
| Hsin pu Township, TW | May 05, 15 - May 05, 15 |
| Hsinchu City, TW | Apr 17, 14 - Dec 03, 15 |
| Hsinchu, TW | Nov 18, 14 - Dec 25, 18 |
| Hsinchu-city, TW | Jun 11, 15 - Jun 11, 15 |
| Hsinpu Township, Hsinchu County, TW | Dec 14, 10 - Aug 14, 18 |
| Hsinpu Township, TW | Aug 19, 10 - Oct 30, 18 |
| Hsinpu, TW | Aug 08, 17 - Aug 08, 17 |
| Taipei, TW | Apr 26, 07 - Apr 26, 07 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| A61N: | ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY | 1 |
| B05C: | APPARATUS FOR APPLYING LIQUIDS OR OTHER FLUENT MATERIALS TO SURFACES, IN GENERAL | 2 |
| B24B: | MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 10161965 | 2018 | Method of test probe alignment control | 6 |
| 10113233 | 2018 | Multi-zone temperature control for semiconductor wafer | 3 |
| 10096482 | 2018 | Apparatus and method for chemical mechanical polishing process control | 1 |
| 10047439 | 2018 | Method and system for tool condition monitoring based on a simulated inline measurement | 0 |
| 9997420 | 2018 | Method and/or system for chemical mechanical planarization (CMP) | 0 |
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