Erik Martinus Marie Manders

Inventor

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Work History

Patent OwnerApplications FiledYear
NIKON CORPORATION
3
2010
UNIVERSITEIT VAN AMSTERDAM
1
1
2005
2009

Inventor Addresses

AddressDuration
USFeb 17, 11 - Feb 17, 11
Amsterdam, NLDec 15, 22 - Sep 21, 23
Charlotteville, TTSep 05, 24 - Sep 05, 24
Monnickendam, NLJun 08, 06 - Mar 06, 12

Technology Profile

Technology Matters
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 2
G02B: OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS 3
G09F: DISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2024/0295,7262024RESCAN OPTICAL SYSTEM, MICROSCOPE AND METHOD0
2023/0296,8702023RE-SCAN OPTICAL SYSTEMS AND METHODS0
2022/0397,7512022RE-SCAN MICROSCOPE SYSTEM AND METHOD0
81296972012Laser scanning microscope1
2011/0085,0752011Method for Imaging an Object0

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