Alex Mak

Inventor

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Details

Work History

Patent OwnerApplications FiledYear
BEL Legacy Corporation
1
2013
SANDISK TECHNOLOGIES LLC
4
4
2
2
2
2
10
2006
2007
2010
2011
2012
2013
2014
AMETEK, INC.
2
2013

Inventor Addresses

AddressDuration
Canton, MA, USFeb 20, 14 - Apr 05, 22
Los Altos Hills, CAJul 03, 08 - Dec 18, 08
Los Altos Hills, CA, USJan 13, 09 - May 03, 16
Los Altos, CA, USMar 21, 13 - Jun 07, 16

Technology Profile

Technology Matters
G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1
G06F: ELECTRIC DIGITAL DATA PROCESSING 3

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
112937432022Texture analyzer0
2020/0200,5212020TEXTURE ANALYZER0
95132022016Viscometer2
93619862016High endurance non-volatile storage5
93307782016Group word line erase and erase-verify methods for 3D non-volatile memory11

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