Daniel Mahgerefteh
Inventor
Stats
- 57 US patents issued
- 104 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 57 US Patents Issued
- 104 US Applications Filed
- 878 Total Citation Count
- Sep 16, 2024 Most Recent Filing
- Feb 19, 1998 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| AZNA CORPORATION | 2
2 | 2002
2003 |
| UNIVERSITY OF MARYLAND, BALTIMORE | 1
| 2000
|
| NATIONAL SECURITY AGENCY | 1
1 | 1998
1999 |
| TRIQUINT TECHNOLOGY HOLDING CO., A DELAWARE CORPORATION | 1
| 2002
|
| AGERE SYSTEMS GUARDIAN CORP. | 1
| 2002
|
| FINISAR CORPORATION | 4
4 8 18 7 18 23 4 5 2 5 4 2 | 2002
2003 2004 2005 2006 2007 2008 2009 2012 2014 2015 2016 2017 |
| AZNA LLC | 1
| 2005
|
| COHERENT, INC. | 2
| 2006
|
| PAK SHING CHO | 1
| 1998
|
| WSOU INVESTMENTS, LLC | 2
| 2002
|
| LUCENT TECHNOLOGIES INC. | 2
| 2002
|
| OPTICAL HORIZONS CORPORATION | 2
| 2002
|
Inventor Addresses
| Address | Duration |
|---|---|
| 10620 Wilkins Ave., #4, Los Angeles, CA 90024 | Nov 08, 05 - Nov 08, 05 |
| 3005 Porter St. NW., Washington, DC 20008 | Oct 26, 99 - Aug 15, 00 |
| 3005 Porterst NW., Washington, DC 20008 | Apr 04, 00 - Apr 04, 00 |
| Campbell, CA, US | Oct 06, 22 - Jan 09, 25 |
| Los Angeles, CA | Jan 01, 02 - Jul 29, 08 |
| Los Angeles, CA, US | Sep 19, 02 - Jan 28, 25 |
| Palo Alto, CA, US | Jan 14, 10 - Jan 14, 10 |
| Palo Alto, CA | Jul 03, 08 - Oct 09, 08 |
| Palo Alto, CA, US | Jan 01, 09 - Sep 04, 12 |
| Palo Alto, MA, US | Sep 27, 11 - Sep 27, 11 |
| San Francisco, CA, US | Apr 22, 10 - Jun 12, 12 |
| Somerville, MA | Aug 09, 07 - Aug 14, 08 |
| Somerville, MA, US | Jan 06, 09 - Oct 05, 10 |
| Sunnyvale, CA, US | Mar 12, 20 - Jul 12, 22 |
| Washington, DC | Jun 27, 00 - Dec 18, 01 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
| G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 6 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 12211755 | 2025 | Wafer level testing of optical components | 0 |
| 2025/0015,106 | 2025 | ELECTROMAGNETIC RADIATION DETECTORS INTEGRATED WITH IMMERSION LENSES | 0 |
| 2024/0405,135 | 2024 | Electromagnetic Radiation Detectors with Lattice-Matched Epitaxial Anti-Reflection Structures | 0 |
| 12149051 | 2024 | Dual grating-coupled lasers | 0 |
| 2024/0363,775 | 2024 | Photodetector with Improved Performance | 0 |
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