Gian Francesco Lorusso
Inventor
Stats
- 14 US patents issued
- 18 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 14 US Patents Issued
- 18 US Applications Filed
- 89 Total Citation Count
- Aug 9, 2024 Most Recent Filing
- Nov 9, 2001 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
INTERUNIVERSITAIR MICROELEKTRONICA CENTRUM VZW (IMEC) | 2
3 2 | 2007
2008 2011 |
IMEC | 2
2 4 | 2007
2008 2011 |
SAMSUNG ELECTRONICS CO., LTD. | 2
| 2008
|
KLA-TENCOR CORPORATION | 1
| 2001
|
KLA-TENCOR TECHNOLOGIES CORPORATION | 1
3 2 3 2 | 2001
2002 2003 2004 2006 |
Inventor Addresses
Address | Duration |
---|---|
Fremont, CA | Dec 30, 03 - Oct 02, 07 |
Fremont, CA, US | Jan 01, 04 - Jan 01, 04 |
Leuveen, BE | Jul 29, 08 - Sep 09, 08 |
Leuven, BE | Sep 21, 23 - Sep 21, 23 |
Overijse, BE | Sep 18, 08 - Feb 13, 25 |
Union City, CA | Aug 31, 04 - Aug 31, 04 |
Technology Profile
Technology | Matters | |
---|---|---|
A61N: | ELECTROTHERAPY; MAGNETOTHERAPY; RADIATION THERAPY; ULTRASOUND THERAPY | 2 |
B23P: | OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS | 1 |
B82Y: | SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2025/0052,703 | 2025 | METHOD FOR EVALUATING THE BENDING STIFFNESS OF HIGH ASPECT RATIO NANOSIZED STRUCTURES | 0 |
2023/0298,854 | 2023 | METHOD OF PERFORMING METROLOGY ON A MICROFABRICATION PATTERN | 0 |
2022/0392,742 | 2022 | Pattern Height Metrology Using an E-Beam System | 0 |
9104122 | 2015 | Methods and systems for evaluating extreme ultraviolet mask flatness | 0 |
9086638 | 2015 | Detection of contamination in EUV systems | 0 |
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