Riccardo Locatelli

Inventor

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Work History

Patent OwnerApplications FiledYear
STMICROELECTRONICS, INC.
1
2012
STMicroelectronics S.A.
2
6
6
1
2005
2007
2008
2014
STMICROELECTRONICS S.R.L.
4
2014
MUNCK, WILLIAM A.
1
2008
STMICROELECTRONICS (GRENOBLE) SAS
1
2008
ROLAND CORPORATION
1
2009
STMICROELECTRONICS (CROLLES 2) SAS
1
1
2011
2012
STMICROELECTRONICS (GRENOBLE 2) SAS
2
1
2
2
4
2008
2011
2012
2013
2014

Inventor Addresses

AddressDuration
Acquaviva Picena, ITDec 25, 12 - Dec 25, 12
Fontanil, FRMar 13, 08 - Jan 21, 20
Grenoble, FRDec 29, 05 - Jan 08, 13
Le Fontanil, FRNov 29, 07 - May 25, 10
Pisa, ITDec 05, 19 - Dec 05, 19
Santa Clara, CA, USNov 24, 20 - Nov 24, 20

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1
G06F: ELECTRIC DIGITAL DATA PROCESSING 9
H03K: PULSE TECHNIQUE 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
108464392020Functional safety over trace-and-debug1
105402772020Method and apparatus for supporting the use of interleaved memory regions1
2019/0370,5032019FUNCTIONAL SAFETY OVER TRACE-AND-DEBUG1
104194322019Method and apparatus for use with different memory maps0
96609362017Method and apparatus for supporting reprogramming or reconfiguring0

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