Riccardo Locatelli
Inventor
Stats
- 13 US patents issued
- 18 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 13 US Patents Issued
- 18 US Applications Filed
- 227 Total Citation Count
- Jun 28, 2019 Most Recent Filing
- Jun 21, 2005 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
STMICROELECTRONICS, INC. | 1
| 2012
|
STMicroelectronics S.A. | 2
6 6 1 | 2005
2007 2008 2014 |
STMICROELECTRONICS S.R.L. | 4
| 2014
|
MUNCK, WILLIAM A. | 1
| 2008
|
STMICROELECTRONICS (GRENOBLE) SAS | 1
| 2008
|
ROLAND CORPORATION | 1
| 2009
|
STMICROELECTRONICS (CROLLES 2) SAS | 1
1 | 2011
2012 |
STMICROELECTRONICS (GRENOBLE 2) SAS | 2
1 2 2 4 | 2008
2011 2012 2013 2014 |
Inventor Addresses
Address | Duration |
---|---|
Acquaviva Picena, IT | Dec 25, 12 - Dec 25, 12 |
Fontanil, FR | Mar 13, 08 - Jan 21, 20 |
Grenoble, FR | Dec 29, 05 - Jan 08, 13 |
Le Fontanil, FR | Nov 29, 07 - May 25, 10 |
Pisa, IT | Dec 05, 19 - Dec 05, 19 |
Santa Clara, CA, US | Nov 24, 20 - Nov 24, 20 |
Technology Profile
Technology | Matters | |
---|---|---|
G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 1 |
G06F: | ELECTRIC DIGITAL DATA PROCESSING | 9 |
H03K: | PULSE TECHNIQUE | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
10846439 | 2020 | Functional safety over trace-and-debug | 1 |
10540277 | 2020 | Method and apparatus for supporting the use of interleaved memory regions | 1 |
2019/0370,503 | 2019 | FUNCTIONAL SAFETY OVER TRACE-AND-DEBUG | 1 |
10419432 | 2019 | Method and apparatus for use with different memory maps | 0 |
9660936 | 2017 | Method and apparatus for supporting reprogramming or reconfiguring | 0 |
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