Shengfa LIANG

Inventor

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Work History

Patent OwnerApplications FiledYear
INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
7
1
2
2013
2014
2015
THE INSTITUTE OF MICROELECTRONICS OF CHINESE ACADEMY OF SCIENCES
1
2015
Institute of Microelectronics, Chinese Academy of
1
2014

Inventor Addresses

AddressDuration
Beijing, CNNov 12, 15 - Mar 30, 21

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 1
B08B: CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 1
B82Y: SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE  OR TREATMENT OF NANO-STRUCTURES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
109645292021Method for cleaning lanthanum gallium silicate wafer0
97622172017Random sampler adapted to one-dimension slow-varying signal0
95628842017gas sensor for detection at room temperature0
2017/0018,4242017METHOD FOR CLEANING LANTHANUM GALLIUM SILICATE WAFER0
94557412016Method for collecting signal with sampling frequency lower than Nyquist frequency0

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