Shimon Levi
Inventor
Stats
- 5 US patents issued
- 10 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 5 US Patents Issued
- 10 US Applications Filed
- 68 Total Citation Count
- Aug 17, 2020 Most Recent Filing
- Feb 26, 1996 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| APPLIED MATERIALS ISRAEL, LTD. | 2
2 2 2 | 2008
2013 2015 2016 |
Inventor Addresses
| Address | Duration |
|---|---|
| 6542 Tony Ave., West Hills, CA 91307 | May 13, 97 - May 13, 97 |
| Kiryat -Tivon, IL | Nov 22, 18 - Dec 03, 20 |
| Kiryat Tivon, IL | Apr 12, 22 - Apr 12, 22 |
| Kiryat-Tivon, IL | Aug 04, 20 - Dec 09, 21 |
| Tivon, IL | Jan 22, 09 - Jul 16, 19 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| A63H: | TOYS, e.g. TOPS, DOLLS, HOOPS, BUILDING BLOCKS | 1 |
| B82Y: | SPECIFIC USES OR APPLICATIONS OF NANO-STRUCTURES; MEASUREMENT OR ANALYSIS OF NANO-STRUCTURES; MANUFACTURE OR TREATMENT OF NANO-STRUCTURES | 1 |
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 2 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 11301983 | 2022 | Measuring height difference in patterns on semiconductor wafers | 0 |
| 2021/0383,529 | 2021 | METHOD, SYSTEM AND COMPUTER PROGRAM PRODUCT FOR 3D-NAND CDSEM METROLOGY | 1 |
| 2020/0380,668 | 2020 | MEASURING HEIGHT DIFFERENCE IN PATTERNS ON SEMICONDUCTOR WAFERS | 0 |
| 10748272 | 2020 | Measuring height difference in patterns on semiconductor wafers | 0 |
| 10731979 | 2020 | Method for monitoring nanometric structures | 0 |
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