Dong-ik LEE

Inventor

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Work History

Patent OwnerApplications FiledYear
SAMSUNG ELECTRONICS CO., LTD.
4
2
2
2
2012
2013
2014
2015

Inventor Addresses

AddressDuration
Seongnam-si, KRDec 18, 14 - Apr 01, 25
Seoul, KRSep 13, 12 - Dec 14, 21
Suwon-si, Gyeonggi-do, KROct 18, 18 - Oct 18, 18
Suwon-si, KRApr 21, 20 - Apr 21, 20

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1
G05B: CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
122677992025Method and apparatus for registering wireless device in wireless communication system0
2024/0155,5312024METHOD AND APPARATUS FOR REGISTERING WIRELESS DEVICE IN WIRELESS COMMUNICATION SYSTEM0
118894532024Method and apparatus for registering wireless device in wireless communication system0
2023/0099,0382023METHOD AND APPARATUS FOR REGISTERING WIRELESS DEVICE IN WIRELESS COMMUNICATION SYSTEM2
115468722023Method and apparatus for registering wireless device in wireless communication system0

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