Guenadiy Lazarov
Inventor
Stats
- 3 US patents issued
- 4 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 4 US Applications Filed
- 71 Total Citation Count
- Jun 2, 2006 Most Recent Filing
- Dec 3, 2001 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| RUDOLPH TECHNOLOGIES, INC. | 2
1 | 2004
2006 |
| HONEYWELL INTERNATIONAL INC. | 2
2 | 2001
2002 |
Inventor Addresses
| Address | Duration |
|---|---|
| Landing, NJ | Apr 13, 04 - Mar 28, 06 |
| Landing, NJ, US | Jun 05, 03 - Jan 21, 10 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B32B: | LAYERED PRODUCTS, i.e. PRODUCTS BUILT-UP OF STRATA OF FLAT OR NON-FLAT, e.g. CELLULAR OR HONEYCOMB, FORM | 1 |
| G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2010/0012,855 | 2010 | Wafer Scanning | 2 |
| 2006/0072,120 | 2006 | MEASURING ELASTIC MODULI OF DIELECTRIC THIN FILMS USING AN OPTICAL METROLOGY SYSTEM | 1 |
| 7019845 | 2006 | Measuring elastic moduli of dielectric thin films using an optical metrology system | 6 |
| 6991847 | 2006 | Light emitting photonic crystals | 12 |
| 6721476 | 2004 | Optical demultiplexer based on three-dimensionally periodic photonic crystals | 9 |
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