Willem Gerhardus Johannes Langeveld

Inventor

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Work History

Patent OwnerApplications FiledYear
Rapidscan Systems, Inc.
1
2014
RAPISCAN SYSTEMS, INC.
1
3
1
2
1
2010
2011
2012
2014
2016

Inventor Addresses

AddressDuration
Menlo Park, CA, USSep 29, 11 - Jul 26, 22

Technology Profile

Technology Matters
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 3
G01T: MEASUREMENT OF NUCLEAR OR X-RADIATION 2
G01V: GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS 2

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
113972692022Systems and methods for compton scatter and/or pulse pileup detection0
2021/0231,8192021Systems and Methods for Compton Scatter And/Or Pulse Pileup Detection1
103454792019Portable X-ray scanner5
2017/0131,4282017Portable X-Ray Scanner7
92245732015System and method for X-ray source weight reduction0

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