Matthias Langer
Inventor
Stats
- 4 US patents issued
- 6 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 4 US Patents Issued
- 6 US Applications Filed
- 55 Total Citation Count
- Sep 9, 2013 Most Recent Filing
- Jul 20, 2007 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| FRIMO VIERSEN GMBH | 1
| 2008
|
| CARL ZEISS MICROSCOPY GMBH | 2
1 2 2 | 2010
2011 2012 2013 |
| SAP SE | 2
| 2007
|
| BOLLHOFF VERBINDUNGSTECHNIK GMBH | 1
| 2008
|
Inventor Addresses
| Address | Duration |
|---|---|
| Heubach, DE | Oct 14, 10 - Aug 27, 13 |
| Heubach-Lautern, DE | Jun 25, 13 - Jan 03, 17 |
| Malsch, DE | Jan 22, 09 - Oct 26, 10 |
| Waidhaus, DE | Mar 19, 09 - Mar 19, 09 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B23P: | OTHER WORKING OF METAL; COMBINED OPERATIONS; UNIVERSAL MACHINE TOOLS | 1 |
| F16B: | DEVICES FOR FASTENING OR SECURING CONSTRUCTIONAL ELEMENTS OR MACHINE PARTS TOGETHER, e.g. NAILS, BOLTS, CIRCLIPS, CLAMPS, CLIPS OR WEDGES; JOINTS OR JOINTING | 1 |
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 2 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 9536704 | 2017 | Method for avoiding artefacts during serial block face imaging | 1 |
| 2014/0092,230 | 2014 | METHOD FOR AVOIDING ARTEFACTS DURING SERIAL BLOCK FACE IMAGING | 7 |
| 8519355 | 2013 | Charged particle source | 2 |
| 8471203 | 2013 | Particle-beam microscope | 3 |
| 2013/0153,742 | 2013 | ARRANGEMENT FOR HOLDING A PARTICLE BEAM APPARATUS | 0 |
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