Ken G Lagarec
Inventor
Stats
- 3 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 3 US Applications Filed
- 8 Total Citation Count
- Jun 6, 2016 Most Recent Filing
- Apr 24, 2013 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| TECHINSIGHTS INC. | 1
2 2 | 2013
2014 2016 |
Inventor Addresses
| Address | Duration |
|---|---|
| Ottawa, CA | Jul 29, 14 - Mar 13, 18 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 2 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 2 |
| G21G: | CONVERSION OF CHEMICAL ELEMENTS; RADIOACTIVE SOURCES | 3 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 9915628 | 2018 | Circuit tracing using a focused ion beam | 2 |
| 2016/0282,287 | 2016 | CIRCUIT TRACING USING A FOCUSED ION BEAM | 0 |
| 9383327 | 2016 | Circuit tracing using a focused ion beam | 0 |
| 2014/0319,343 | 2014 | CIRCUIT TRACING USING A FOCUSED ION BEAM | 2 |
| 8791436 | 2014 | Circuit tracing using a focused ion beam | 4 |
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