Simon Labouesse
Inventor
Stats
- 0 US patents issued
- 3 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 0 US Patents Issued
- 3 US Applications Filed
- 2 Total Citation Count
- Feb 18, 2022 Most Recent Filing
- Sep 30, 2020 Earliest Filing
Work History
No Work History Available.Inventor Addresses
Address | Duration |
---|---|
Boulder, CO, US | Mar 18, 21 - May 28, 24 |
Technology Profile
Technology | Matters | |
---|---|---|
A61B: | DIAGNOSIS; SURGERY; IDENTIFICATION | 2 |
G01J: | MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY | 1 |
G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
11994533 | 2024 | Methods and systems for scanning probe sample property measurement and imaging | 0 |
2024/0134,179 | 2024 | Methods And Systems For High-Resolution And High Signal-To-Noise Ratio Imaging Through Generalized Media | 0 |
2022/0390,369 | 2022 | Systems And Methods For Imaging And Characterizing Objects Including The Eye Using Non-Uniform Or Speckle Illumination Patterns | 1 |
2021/0080,484 | 2021 | Methods And Systems For Scanning Probe Sample Property Measurement And Imaging | 0 |
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