Simon Labouesse

Inventor

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Inventor Addresses

AddressDuration
Boulder, CO, USMar 18, 21 - May 28, 24

Technology Profile

Technology Matters
A61B: DIAGNOSIS; SURGERY; IDENTIFICATION 2
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
119945332024Methods and systems for scanning probe sample property measurement and imaging0
2024/0134,1792024Methods And Systems For High-Resolution And High Signal-To-Noise Ratio Imaging Through Generalized Media0
2022/0390,3692022Systems And Methods For Imaging And Characterizing Objects Including The Eye Using Non-Uniform Or Speckle Illumination Patterns1
2021/0080,4842021Methods And Systems For Scanning Probe Sample Property Measurement And Imaging0

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