Choon Leong Lou
Inventor
Stats
- 16 US patents issued
- 84 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 16 US Patents Issued
- 84 US Applications Filed
- 146 Total Citation Count
- Mar 29, 2024 Most Recent Filing
- Dec 11, 2003 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
STAR TECHNOLOGIES, INC. | 1
1 2 1 7 13 10 4 6 2 4 2 | 2003
2005 2006 2007 2008 2009 2010 2011 2012 2013 2014 2016 |
CORN PRODUCTS DEVELOPMENT, INC. | 1
| 2011
|
Inventor Addresses
Address | Duration |
---|---|
HSINCHU CITY, TW | Mar 04, 10 - Apr 03, 25 |
HSINCHU COUNTY, TW | Jun 26, 08 - Jan 15, 09 |
Hsinchu City, TW | Mar 04, 10 - Jul 14, 22 |
Hsinchu County, TW | Nov 10, 09 - Dec 24, 09 |
Hsinchu, TW | Mar 27, 08 - Jan 28, 25 |
Jhudong Township, TW | Sep 24, 09 - Mar 09, 10 |
SINGAPORE, SG | May 29, 14 - Apr 03, 25 |
SUZHOU CITY, CN | Dec 08, 22 - Dec 15, 22 |
Singapore, SG | Jun 24, 04 - Mar 18, 25 |
Suzhou City, CN | Jul 14, 22 - Feb 01, 24 |
Suzhou, CN | Jan 31, 23 - Oct 15, 24 |
Technology Profile
Technology | Matters | |
---|---|---|
F27B: | FURNACES, KILNS, OVENS, OR RETORTS IN GENERAL; OPEN SINTERING OR LIKE APPARATUS | 1 |
F28F: | DETAILS OF HEAT-EXCHANGE OR HEAT-TRANSFER APPARATUS, OF GENERAL APPLICATION | 1 |
G01B: | MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
2025/0110,154 | 2025 | PROBE CARD DEVICE | 0 |
2025/0110,153 | 2025 | PROBE CARD AND THERMAL CONDUCTION DEVICE THEREOF | 0 |
2025/0113,435 | 2025 | ELASTIC INTERPOSER AND CONDUCTIVE DEVICE THEREOF | 0 |
2025/0093,386 | 2025 | WAFER TESTING CASSETTE | 0 |
2025/0093,406 | 2025 | WAFER TEST CASSETTE, WAFER TEST SYSTEM AND WAFER TEST METHOD | 0 |
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