Ching-Feng Lee

Inventor

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Work History

Patent OwnerApplications FiledYear
INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
1
3
2
4
2001
2006
2008
2009

Inventor Addresses

AddressDuration
Chiayi, TWJan 24, 19 - Jun 25, 19
Fongyuan City, TWDec 17, 09 - Dec 09, 10
Fongyuan, TWJul 30, 15 - Jul 30, 15
Hsinchu, TWAug 12, 03 - Jul 21, 09
Taichung City, TWDec 16, 21 - Dec 14, 23
Taichung, TWDec 05, 23 - Dec 05, 23
Taipei City, TWJun 18, 09 - Mar 17, 11
Taipei, TWMar 30, 10 - Jan 29, 13
Zhubei City, TWApr 11, 19 - Apr 11, 19

Technology Profile

Technology Matters
G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED BY A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR 1
G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY 1
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
2023/0401,2402023SYSTEM AND METHOD FOR ENTERPRISE PROCESS CONSTRUCTION0
118353892023Temperature measuring device and temperature measuring method0
2021/0389,1852021TEMPERATURE MEASUREING DEVICE AND TEMPERATURE MEASURING METHOD0
103304952019Device for measuring rotational speed0
2019/0107,5592019INPUT BUFFER AND NOISE CANCELLATION METHOD THEREOF0

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