Evelyn Landman
Inventor
Stats
- 3 US patents issued
- 39 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 39 US Applications Filed
- 97 Total Citation Count
- Sep 23, 2024 Most Recent Filing
- Mar 14, 2012 Earliest Filing
Work History
| Patent Owner | Applications Filed | Year |
|---|---|---|
| MELLANOX TECHNOLOGIES LTD. | 1
2 2 3 | 2012
2013 2014 2016 |
| JPMORGAN CHASE BANK, N.A. | 1
| 2016
|
Inventor Addresses
| Address | Duration |
|---|---|
| Haifa, IL | Sep 19, 13 - Apr 03, 25 |
Technology Profile
| Technology | Matters | |
|---|---|---|
| B29C: | SHAPING OR JOINING OF PLASTICS; SHAPING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL; AFTER- TREATMENT OF THE SHAPED PRODUCTS, e.g. REPAIRING | 1 |
| G01K: | MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR | 2 |
| G01R: | MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES | 21 |
Patents / Publication
| Patents / Publication # | Year of Publication / Issued | Title | Citations |
|---|---|---|---|
| 2025/0112,626 | 2025 | INTEGRATED CIRCUIT GLITCH DETECTION | 0 |
| 12241933 | 2025 | Integrated circuit margin measurement for structural testing | 0 |
| 12216976 | 2025 | Efficient integrated circuit simulation and testing | 0 |
| 2025/0012,852 | 2025 | INTEGRATED CIRCUIT SIMULATOR FOR DEGRADATION ESTIMATION AND TIME-OF-FAILURE PREDICTION | 0 |
| 2024/0418,770 | 2024 | INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAKAGE SENSOR | 0 |
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