Ken Hanh Duc Lai

Inventor

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Work History

Patent OwnerApplications FiledYear
ADVANTEST CORPORATION
1
2
6
2000
2010
2014
Avantest (Singapore) PTE Ltd
1
2010

Inventor Addresses

AddressDuration
San Jose, CAJun 08, 04 - Jun 08, 04
Sunnyvale, CA, USMay 22, 14 - Apr 04, 17

Technology Profile

Technology Matters
G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES 2
G11C: STATIC STORES 5

Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
96122722017Testing memory devices with parallel processing operations0
95573722017Tester having an application specific electronics module, and systems and methods that incorporate or use the same0
93307922016Testing memory devices with distributed processing operations3
2015/0255,1762015MEMORY TEST ECC AUTO-CORRECTION OF FAILING DATA6
2015/0255,1752015MEMORY TESTING AND FAILURE DATA FILTERING3

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