Laurens Franz Taemsz Kwakman
Inventor
Stats
- 3 US patents issued
- 5 US Applications filed
- most recent filing
This is official USPTO record data
Details
- 3 US Patents Issued
- 5 US Applications Filed
- 32 Total Citation Count
- Feb 21, 2018 Most Recent Filing
- Apr 16, 2002 Earliest Filing
Work History
Patent Owner | Applications Filed | Year |
---|---|---|
FEI COMPANY | 2
2 1 | 2002
2011 2015 |
KONINKLIJKE PHILIPS ELECTRONICS N.V. | 2
| 2002
|
Inventor Addresses
Address | Duration |
---|---|
Saint Ismier, FR | May 24, 12 - Jan 29, 19 |
St. Ismier, FR | Oct 24, 02 - Jul 30, 19 |
Technology Profile
Technology | Matters | |
---|---|---|
G01K: | MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR | 1 |
G01N: | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES | 4 |
G01T: | MEASUREMENT OF NUCLEAR OR X-RADIATION | 1 |
Patents / Publication
Patents / Publication # | Year of Publication / Issued | Title | Citations |
---|---|---|---|
10366860 | 2019 | High aspect ratio X-ray targets and uses of same | 2 |
10190953 | 2019 | Tomography sample preparation systems and methods with improved speed, automation, and reliability | 1 |
2018/0190,467 | 2018 | HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME | 1 |
2018/0143,110 | 2018 | TOMOGRAPHY SAMPLE PREPARATION SYSTEMS AND METHODS WITH IMPROVED SPEED, AUTOMATION, AND RELIABILITY | 2 |
9934930 | 2018 | High aspect ratio x-ray targets and uses of same | 14 |
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