Laurens Franz Taemsz Kwakman

Inventor

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Work History

Patent OwnerApplications FiledYear
FEI COMPANY
2
2
1
2002
2011
2015
KONINKLIJKE PHILIPS ELECTRONICS N.V.
2
2002

Inventor Addresses

AddressDuration
Saint Ismier, FRMay 24, 12 - Jan 29, 19
St. Ismier, FROct 24, 02 - Jul 30, 19

Technology Profile

Technology Matters
G01K: MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR 1
G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES 4
G01T: MEASUREMENT OF NUCLEAR OR X-RADIATION 1

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Patents / Publication

Patents / Publication #Year of Publication / IssuedTitleCitations
103668602019High aspect ratio X-ray targets and uses of same2
101909532019Tomography sample preparation systems and methods with improved speed, automation, and reliability1
2018/0190,4672018HIGH ASPECT RATIO X-RAY TARGETS AND USES OF SAME1
2018/0143,1102018TOMOGRAPHY SAMPLE PREPARATION SYSTEMS AND METHODS WITH IMPROVED SPEED, AUTOMATION, AND RELIABILITY2
99349302018High aspect ratio x-ray targets and uses of same14

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